Titan aberration-corrected TEM
Apparatus |
| Titan aberration-corrected Transmission Electron Microscope |
Supplier | Thermo Fisher (FEI) | |
Location | VLL, outside cleanroom | |
Applications | - structural characterization - chemical characterization | |
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Specifications/ Capabilities | - this microscope works at 300kV - conventional TEM modes - scanning transmission electron microscopy (STEM) mode - convergent beam and selected area electron diffraction modes - point-to-point spatial resolution in TEM mode: 0.10 nm at 300kV - STEM resolution: 0.12 nm at 300kV - CETA 16M camera - ChemiSTEM system for energy-dispersive X-ray spectroscopy (EDX) chemical compositional analysis - GIF spectrometer for electron energy-loss spectroscopy (EELS) | |
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Sample Resctrictions | - sample thickness: 100 nm or less - maximum sample size: 3nm diameter - materials to be analyzed must be approved by staff (F. Tichelaar and S. Conesa-Boj) - no magnetic materials - materials toxic or potentially toxic are not allowed | |
Equipment Owner | Frans Tichelaar +31 152782252
If you would like to request access to the Titan microscope, please contact Dr Sonia Conesa-Boj for further information, S.C.ConesaBoj@tudelft.nl |