Inspection Bruker FastScan AFMAtomic force microscope Bruker Dektak XTProfilometer TITAN aberration-corrected transmission electron microscope (TEM) FEI NovaNanoSEMSEM with EDX Hitachi S4800 SEMSEM (high-resolutions) JEOL JEM-1400TEM 120 kV, with cryo plunger Optical Microscopes Renishaw Invia ReflexRaman microscope Probe Station, MicroXact SPS-1000 Electrical characterisation Woollam M-2000 Ellipsometer Flexus (TOHO)Stress meter Lucas Labs Pro4 4-point probe FEI Helios G4 CXFIB/SEM Bruker Dimension D8XRD FR-pOrtable Reflectometer Spotifix Particle Counter Basic particle counting Bruker WLI ContourX-500 Lift-off microscope Dino-Lite Hitachi Regulus SEM ultra-high resolution FE-SEM Share this page: Facebook Linkedin Twitter Email WhatsApp Share this page