Jeol JEM-1400 plus TEM

Apparatus

  

JEOL JEM-1400plus TEM

Supplier

JEOL; www.jeol.com

Location

TNW south

Function

Specimen inspection

Main purpose

Transmission electron microscope for imaging in transmission mode

Main characteristics

Acceleration voltage 120 kV

Stage tilt up to 70 o and double tilt holder

EDS detector for spot (>75nm) analysis

Cryo capabilities

Tomography capabilities

Electron diffraction capabilities

Facilities

Gatan Cryo holder and cryo tomo holder, Tomography holder, EDS double tilt holder, Leica cryo-plunger

Specimen

Support film: 3 mm TEM grids, thin samples required

Equipment owner

Wiel Evers

W.H.Evers@tudelft.nl

+31 15 27 84470