Jeol JEM-1400 plus TEM
Apparatus |
| JEOL JEM-1400plus TEM |
Supplier | JEOL; www.jeol.com | |
Location | TNW south | |
Function | Specimen inspection | |
Main purpose | Transmission electron microscope for imaging in transmission mode | |
Main characteristics | Acceleration voltage 120 kV Stage tilt up to 70 o and double tilt holder EDS detector for spot (>75nm) analysis Cryo capabilities Tomography capabilities Electron diffraction capabilities | |
Facilities | Gatan Cryo holder and cryo tomo holder, Tomography holder, EDS double tilt holder, Leica cryo-plunger | |
Specimen | Support film: 3 mm TEM grids, thin samples required | |
Equipment owner | Wiel Evers +31 15 27 84470 |