Bruker XRD
Apparatus |
| Bruker Discover D8 |
Supplier | Bruker-AXS | |
Location | TN building K module | |
Function | Structure characterisation | |
Main Purpose | X-Ray Diffraction analysis of thin films | |
Main Characteristics | High resolution XRD | |
Facilities | X-ray reflectometry, grazing angle diffraction, stress analysis, texture analysis, x-y mapping, reciprocal space mapping | |
Specimen | Flexible, max 80 x 50 x 20 mm | |
Equipment Owner | Hozanna Miro +31 650559998 |