Facilities
A wide range of deposition methods and characterization tools is available in the PVMD group (located within the Else Kooi Lab)
Material deposition
Material characterization
Optical properties
- Total Integrating Scattering (TIS) and Variable Angular Spectrometry (VAS)
- Reflection-Transmission (RT)
- Double Beam Photoconductivity (DBP)
- Fourier Transform Photocurrent Spectroscopy (FTPS)
Electrical properties
Structural properties
- Fourier Transform Infrared Spectroscopy (FTIR)
- Raman Spectroscopy (RS)
- Spectrospic Ellipsometry (SE)
- Photoluminescence (PL)
Defects
Interface characterization
Device performance
