Ir. S. (Sven) Weerdenburg

Ir. S. (Sven) Weerdenburg

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Biography

Sven Weerdenburg obtained his Bachelor of Science degree in Applied Physics at The Hague University of Applied Sciences in 2016. During his bachelor studies, he followed two internships at Airbus Defence and Space in Leiden and cosine measurement systems in Warmond.

After a one-year premaster program, he started his Master of Science in Applied Physics at Delft University of Technology, which he obtained in 2019. He did his master thesis work at the Optics Research Group, under the supervision of Dr. Aurèle Adam, on a proof of concept regarding two-wavelength reflectometry for optical phase change detection. During his studies, he worked part-time at MAPPER Lithography.

In October 2019, he started his PhD, at the Optics Research Group, working with Prof. Wim Coene and Prof. Paul Urbach. His research subject is on Lensless Imaging of 3D Nanostructures with Soft X-Rays (LINX). Shorter wavelengths, like Soft X-Rays, allows high-resolution imaging. However, there are no imaging optics (in general) in this wavelength regime, so a different approach is needed to benefit from the short wavelengths. In lensless imaging, the conventional lens system is replaced by an iterative algorithm that computes an image from a set of measured diffraction patterns. An Soft X-Ray/EUV beamline is built at the TU Delft to demonstrate these news concepts.

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