Publications

• 2024

  Depth-dependent scaling of axial distances in light microscopy

  S. V. Loginov / D. B. Boltje / M. N.F. Hensgens / J. P. Hoogenboom / E. B.van der Wee

• 2024

  FAST-EM array tomography:

  a workflow for multibeam volume electron microscopy
  A.J. Kievits / B.H. Peter Duinkerken / R. Lane / Cecilia de Heus / Daan van Beijeren Bergen en Henegouwen / T.R. Höppener / Anouk H.G. Wolters / Nalan Liv / Ben N.G. Giepmans / J.P. Hoogenboom

• 2024

  Method and apparatus for in-situ sample quality inspection in cryogenic focused ion beam milling

• 2024

  Method for localizing a region of interest in a sample and micromachining the sample using a charged particle beam

• 2024

  Optical STEM detection for scanning electron microscopy

  Arent J. Kievits / B. H.Peter Duinkerken / Job Fermie / Ryan Lane / Ben N.G. Giepmans / Jacob P. Hoogenboom

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