Search
A. Dijkstra
C.J. Woltjes
G.M.H. Meesters
News
News June 2023 In this paper we show how we use sMIM to measure the conductivity in semiconductor layers with a resuloution better than 100…
/en/faculty-of-applied-sciences/about-faculty/departments/chemical-engineering/principal-investigators/tom-savenije/tom-savenije-group/news