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M.H.W. Vijverberg
C. (Cansın) Yüksel
M.A. Montazerolghaem
T. Shajahan
C.H. van der Does
- +31 15 27 88304
- C.H.vanderDoes@tudelft.nl
- 36.LB 00.420
M.G. (Mitra) Smit
Keyence VK-X250
Function The Keyence Microscope is a Laser Scanning Confocal Microscope. It uses confocal microscopy to measure the height of the sample. 3D…
/en/eemcs/research/facilities/else-kooi-lab/equipment/metrology/keyence-vk-x250
Wet Etching line
Function The Wet Etching line is a series of pre-made chemical baths employed for the wet chemical etching of semiconductors (poly-Si),…
/en/eemcs/research/facilities/else-kooi-lab/equipment/others/wet-etching-line
SEM Hitachi Regulus 8230
Function The Hitachi Regulus 8230 is a Scanning Electron Microscope (SEM). The SEM is used for imaging samples with electrons. The…
/en/eemcs/research/facilities/else-kooi-lab/equipment/metrology/sem-hitachi-regulus-8230
SPTS Vapor HF
Function The SPTS Vapor HF is used to etch oxides layers, usually employed as sacrificial layers, to release structures via dry vapor…
/en/eemcs/research/facilities/else-kooi-lab/equipment/others/spts-vapor-hf