Search
P. Bauer
- +31 15 27 84654
- P.Bauer@tudelft.nl
- 36.LB 03.600
Introduction programmes for Master’s, Exchange and bridging students
February 2025 5, 6 and 7 February The Introduction Programme is designed to help give you a good start to your studies in Delft. The…
/en/education/study-programme-orientation/practical-matters/introduction-period/msc-february
Cover article Nature Light: Science & Applications | Computational Imaging for EUV wafer metrology
The paper EUV wafer metrology using computational imaging method “ptychography” has been selected by Nature Light: Science & Applications…
/en/2024/tnw/cover-article-nature-light-science-applications-computational-imaging-for-euv-wafer-metrology
L. Kuipers
N. (Nourhan) Shokry
S.E.Z. (Shrouk Eid Zaki) Ahmed
- S.E.Z.Ahmed@tudelft.nl
- 22.E 024
E.N. (Elianna) Kraan
- E.N.Kraan@tudelft.nl
- 22.F 130
G. (Guohao) Lan
- G.Lan@tudelft.nl
- 28.2.W720
D. (Dabo) Krempus
N.D. Verhulst
- +31 15 27 88620
- N.D.Verhulst@tudelft.nl
- 36.HB 04.230