Dry Etch Recipe for W (sputtered) in Fluorine based RIE
Recipe
Gases: | |
SF6 | 12.5 sccm |
He | 10 sccm |
Pressure | 1.00 Pa |
RF Power | 40 W |
Bias potential | -120 V |
Etch characteristics
Etch rate: 80 nm/min |
Anisotropy: 80 % |
Selectivity
Selective over all non-organic materials |
Remarks
Anisotropy is somewhat substrate temperature dependent |
Reproducibility: 15 % |