Moritz Fieback
About
Moritz Fieback received his PhD degree from Delft University of Technology in the Netherlands in 2022. Currently, he is working as an assistant professor in the same university. His research interests include device and defect modeling, test and reliability of emerging memories, and computation-in-memory systems. He has co-authored over 40 articles and won 3 best paper awards.
Publications
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2024
A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing
T. S. Copetti / M. Fieback / T. Gemmeke / S. Hamdioui / L. M.Bolzani Poehls
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2024
Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing
H. Aziza / J. Postel-Pellerin / M. Fieback / S. Hamdioui / H. Xun / M. Taouil / K. Coulie / W. Rahajandraibe
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2024
Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs
T. S. Copetti / A. Chordia / M. Fieback / M. Taouil / S. Hamdioui / L. M. Bolzani Poehls
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2024
Design-for-Test for Intermittent Faults in STT-MRAMs
Sicong Yuan / Mohammad Amin Yaldagard / Hanzhi Xun / Moritz Fieback / Erik Jan Marinissen / Woojin Kim / Siddharth Rao / Sebastien Couet / Mottaqiallah Taouil / Said Hamdioui
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2024
Device-Aware Diagnosis for Yield Learning in RRAMs
Hanzhi Xun / Moritz Fieback / Sicong Yuan / Hassen Aziza / Mottaqiallah Taouil / Said Hamdioui
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