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M. (Mina) Akhavan
- M.A.Akhavan@tudelft.nl
- 08.01+.Oost.710
H. (Hanchu) Sun
- H.Sun-1@tudelft.nl
- 32.B-4-360
A. (Abishay) Mohan
- A.Mohan-1@tudelft.nl
- 62.NB 0.54
R.J.A. (Remco) Blijleven
A.P.S. (Ardya) Inderawan
Vocareum
Home (Teaching Support) Educational Tools Open menu Overview Ans Buddycheck Brightspace Collegerama ConTest FeedbackFruits Grasple H5P…
/en/teaching-support/educational-tools/vocareum
Cover article Nature Light: Science & Applications | Computational Imaging for EUV wafer metrology
The paper EUV wafer metrology using computational imaging method “ptychography” has been selected by Nature Light: Science & Applications…
/en/2024/tnw/cover-article-nature-light-science-applications-computational-imaging-for-euv-wafer-metrology