Stefan Witte

Research Interest: Optics for nanoscale metrology

Academic Background:

Stefan Witte received his PhD (cum laude) in 2007 from the Vrije Universiteit Amsterdam, for research on intense ultrafast laser development and precision spectroscopy with frequency combs. He did postdoctoral work at on nonlinear microscopy and biomedical imaging (Vrije Universiteit) and on ultrafast electron dynamics and lensless imaging with high-harmonic sources (JILA, University of Colorado).

From 2014, Stefan worked at the Advanced Research Center for Nanolithography (ARCNL), where he lead the EUV Generation and Imaging group at ARCNL and was the head of the Metrology Department. Since 2019, he was also an associate professor at the Vrije Universiteit Amsterdam.

Stefan was awarded an ERC Starting Grant in 2014, an ERC Consolidator Grant in 2019, and an NWO VICI grant in 2022. He is also a Principal Investigator in the NWO-TTW Perspectief consortium LINX (Lensless Imaging with soft-X-rays).