Jacob Hoogenboom
Research Interest: Integrated microscopy, SEM fluorescence CLEM, Ultrafast microscopy, Molecular nanophotonics
Academic Background:
Jacob Hoogenboom (1972) is associate professor at Delft University of Technology since October 2008. He obtained his PhD in September 2002 from Utrecht University for research conducted at the FOM Institute for Atomic and Molecular Physics (AMOLF) in Amsterdam. In the following years, he worked as a postdoctoral researcher at the MESA+ Institute for Nanotechnology at University of Twente and as a research fellow at ICFO - the Institute of Photonic Sciences in Castelldefels (Barcelona) in Spain. In 2008, he spent 8 months at Utrecht University.
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2024
Depth-dependent scaling of axial distances in light microscopy
S. V. Loginov / D. B. Boltje / M. N.F. Hensgens / J. P. Hoogenboom / E. B.van der Wee
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2024
FAST-EM array tomography:
a workflow for multibeam volume electron microscopy
A.J. Kievits / B.H. Peter Duinkerken / R. Lane / Cecilia de Heus / Daan van Beijeren Bergen en Henegouwen / T.R. Höppener / Anouk H.G. Wolters / Nalan Liv / Ben N.G. Giepmans / J.P. Hoogenboom -
2024
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2024
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2024
Optical STEM detection for scanning electron microscopy
Arent J. Kievits / B. H.Peter Duinkerken / Job Fermie / Ryan Lane / Ben N.G. Giepmans / Jacob P. Hoogenboom
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* The above keywords are automatically generated by the TU Delft research portal
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2024-06-01
Open interactief leerboek elektriciteit en magnetisme
Appeared in: Nederlands Tijdschrift voor Natuurkunde, vol. 90, nr. 6, p. 18-20
