Jacob Hoogenboom & Albert Polman receive funding from National Growth Fund programme NXTGENHightech
In total, the consortia will receive more than 11 million euros in grants. The co-funders of the projects will also provide an additional 5 million euros in funding. These grants were awarded as a result of NXTGEN Hightech's first call for proposals, ‘Future-proof high-tech equipment’. This call for proposals specifically asked for research proposals that would maintain and reinforce the Netherlands' current strength in high-tech equipment.
"Optimized Low-Voltage Multi-Beam Electron Microscope and High Througput CL detection"
Main applicant: Dr J.P. Hoogenboom – Delft University of Technology
Co-applicant: Prof. A Polman (AMOLF)
Investigating materials at the highest possible resolution with electron microscopy is crucial for understanding diseases and for quality control in manufacturing computer chips. At present, electron microscopes image samples with only one beam, which makes them too slow to image samples larger than about 1 mm. The researchers will implement several innovations to make an electron microscope that can illuminate samples with many beams in parallel and that is also very sensitive to signals generated specifically by defects in the materials.
