Postdoc: Nonlinear dynamic atomic force microscopy

Our research group Dynamics of Micro and Nanosystems (DMN)  is looking for a Postdoc working on Nonlinear dynamic atomic force microscopy .

Atomic Force Microscopy (AFM) has evolved into a useful tool for nanoscale imaging of surfaces with high resolution in many technical and scientific application areas. Major efforts are invested into quantitative measurement of nano-mechanical properties of samples. However, these measurements typically rely on nanoindentation techniques where the large contact force during snap into contact can cause irreversible damage to the tip and the sample. This poses a big challenge in proper mechanical characterization of ultra-thin membranes where such damages could rupture the membrane and yield unreliable measurements.

As a postdoc you will be working on developing new techniques to accurately probe tip-sample interactions utilizing nonlinear dynamic response of AFM in contact with hard as well as soft suspended nanomaterials.

Interested? Please find for more detailed information and the way to apply here.