A new type of integrated microscope developed within ImPhys by Jayson Sueters under supervision of Jacob Hoogenboom, is highlighted in the latest NWO-TTW newsletter. The new system allows to add confocal fluorescence microscope to a scanning electron microscope, which can be particularly beneficial for correlative imaging of thick samples or samples in liquid.
The TU Delft prototype was developed in collaboration with Delmic and Nikon in a project funded by the NWO-TTW Perspectief program Microscopy Valley. Based on the prototype, Delmic developed a commercial product, the first of which was recently installed at a customer in Leuven.
