![](https://filelist.tudelft.nl/_processed_/c/3/csm_u2n2n3_12642b08dd.jpg)
H. (Hanzhi) Xun
H. (Hanzhi) Xun
Profiel
Hanzhi Xun received the B.Sc. and M.Eng. degrees from Xidian University, Xi'an, China, in 2018 and 2021, respectively. He also received M.Eng. degree form Waseda University, Kitakyushu, Japan, in 2021. He is currently working toward the Ph.D. degree at the Computer Engineering Laboratory, Delft University of Technology, Delft, The Netherlands. His research interests focus on device modeling, testing, and reliability of Resistive RAMs.
Expertise
Publicaties
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2024
Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing
H. Aziza / J. Postel-Pellerin / M. Fieback / S. Hamdioui / H. Xun / M. Taouil / K. Coulie / W. Rahajandraibe
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2024
Design-for-Test for Intermittent Faults in STT-MRAMs
Sicong Yuan / Mohammad Amin Yaldagard / Hanzhi Xun / Moritz Fieback / Erik Jan Marinissen / Woojin Kim / Siddharth Rao / Sebastien Couet / Mottaqiallah Taouil / Said Hamdioui
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2024
Device-Aware Diagnosis for Yield Learning in RRAMs
Hanzhi Xun / Moritz Fieback / Sicong Yuan / Hassen Aziza / Mottaqiallah Taouil / Said Hamdioui
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2024
Online Detection of Unique Faults in RRAMs
Hanzhi Xun / Moritz Fieback / Mohammad Amin Yaldagard / Sicong Yuan / Hassen Aziza / Mottaqiallah Taouil / Said Hamdioui
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2023
Characterization and Test of Intermittent Over RESET in RRAMs
Hanzhi Xun / Moritz Fieback / Sicong Yuan / Hassen Aziza / Mathijs Heidekamp / Thiago Copetti / Leticia Bolzani Poehls / Mottaqiallah Taouil / Said Hamdioui
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