Dr. F.M. (Frans) Vos

Dr. F.M. (Frans) Vos

Profiel

Expertise

Medical Image Analysis, Quantitative MRI: MRI fingerprinting, Dynamic Contrast Enhanced MRI.

Biografie

Frans Vos obtained his MSc both in Computer Science and Medical Informatics from the University of Amsterdam in 1993. For that purpose he performed  graduation work at Yale University in the Biomedical Imaging Sciences Division supervised by Jim Duncan. In 1998 He got his PhD from the Vrije Universiteit of Amsterdam: his PhD thesis was on a technique for measuring the shape of the cornea using pseudo random encoding. Currently, he is associate professor with both the Department of Imaging Physics at Delft University of Technology and the Department of Radiology at the ErasmusMC. He has a strong background in quantitative analysis of MR images and identification of imaging biomarkers.

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